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Reliability Improvement on SRAM Physical Unclonable Function (PUF) Using an 8T Cell in 28nm FDSOI
Reliability Improvement on SRAM Physical Unclonable Function (PUF) Using an 8T Cell in 28nm FDSOI
2021
Ze-Xin Su
Bo Li
Weidong Zhang
Jiantou Gao
Xiaohui Su
Gang Zhang
Hongyu Ren
Peng Lu
Fanyu Liu
Fazhan Zhao
Shi Li
Keywords:
Static random-access memory
Reliability (statistics)
Reliability engineering
Computer science
Physical unclonable function
Correction
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