A semiconductor component delivery system associated with a turret type testing apparatus

The invention discloses a semiconductor component delivery system associated with a turret type testing apparatus for testing integrity and functionality of semiconductor components, wherein at least two input feeders loadable with semiconductor components to be vision checked, tested and/or packed are provided. The delivery system is also provided with multiple output means such as a tube, a tape or a bin or a combination thereof for semiconductor components determined to be non defective.