An Equivalent Model of Pattern Generator in Jitter Testing

Abstract Pattern generator is used to provide the stimulus in jitter testing. An equivalent model is proposed in order to determine the impact of non-ideal pattern generator on data jitter. Our model consists of an ideal square wave generator and a shaping filter. The algorithm of extracting the impulse response of the shaping filter is introduced. Analytical expressions of probability distribution function (PDF) of data jitter and bit error rate (BER) are given based on impulse response of the system. This model is verified in a set of experiments. It is shown the non-ideal pattern generator greatly changes the PDF of data jitter and exacerbates link BER. The estimated jitter with the impact of non-ideal pattern generator accords well with measured one, and the equivalent model has high accuracy.