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A sampling and conditioning particle system for solid particle measurements down to 10 nm
A sampling and conditioning particle system for solid particle measurements down to 10 nm
2019
Leonidas Chasapidis
Anastasios D. Melas
Apostolos Tsakis
Dimitrios Zarvalis
Athanasios G. Konstandopoulos
Keywords:
Computational physics
Sampling (statistics)
Conditioning
Particle
Particle system
Materials science
solid particle
Analytical chemistry
Correction
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