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poly-Si 電極における仕事関数変調とそのデバイスインパクト : SiON/poly-Si 界面の微量Hfの効果
poly-Si 電極における仕事関数変調とそのデバイスインパクト : SiON/poly-Si 界面の微量Hfの効果
2005
zirou yu ue
yasuhiro simamoto
masao inoue
sei osamu mizutani
katuya siga
fumiko fuzita
jun'iti tutimoto
yosikazu oono
masahiro yoneda
Keywords:
Artificial intelligence
Machine learning
Computer science
Work function
Electronic engineering
Condensed matter physics
fermi level pinning
Pattern recognition
Correction
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