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The interface structure of directly bonded Si crystals studied by synchrotron X-ray diffraction
The interface structure of directly bonded Si crystals studied by synchrotron X-ray diffraction
1999
Mourits Nielsen
Robert Feidenhansl
Paul B. Howes
Francois Grey
S. Weichel
Jan Vedde
Kurt Rasmussen
Keywords:
Crystallography
Synchrotron X-Ray Diffraction
Crystal
Materials science
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