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Electrical characterization of memory cell structures using multiple tunnels junctions with embedded Si nanocrystals
Electrical characterization of memory cell structures using multiple tunnels junctions with embedded Si nanocrystals
2002
Damien Deleruyelle
D. Fraboulet
B. De Salvo
N. Buffet
Denis Mariolle
Thierry Baron
Jean-Luc Autran
B. Guillaumot
Keywords:
Nanocrystal
Materials science
Optoelectronics
Memory cell
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