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Simulation of morphological evolution and RHEED intensity oscillations during thin-film growth
Simulation of morphological evolution and RHEED intensity oscillations during thin-film growth
1997
Kui-juan Jin
Shao Hua Pan
Guo Zhen Yang
Keywords:
Thin film
Surface roughness
Oscillation
Layer by layer
Optics
Materials science
Reflection high-energy electron diffraction
Correction
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