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Characterization and Modeling of DC & RF Breakdown in Microscale Gaps near Vacuum
Characterization and Modeling of DC & RF Breakdown in Microscale Gaps near Vacuum
2021
Christopher J Moore
Alexander Ruyack
Matthew B. Jordan
Gwendolyn Hummel
Sergio Herrera
Andrew Bingham
Adrian R. B. Schiess
Christopher Gibson
Christopher D. Nordquist
Keywords:
Optoelectronics
characterization
Microscale chemistry
Materials science
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