Broadband characterization of dielectric materials from RF, millimeter-wave to THz frequencies accounting for anisotropy

In this paper, experimental characterization of dielectric materials from RF, mm-Wave to THz frequencies accounting for Anisotropy is presented. Broadband extraction of complex permittivity values and dissipation factors for various materials is proposed. A more specific focus is particularly done on a Liquid crystal Polymer (LCP) and passive components on BiCMOS technology with Deep-Trench-Insulator patterns (DTI). Perspectives for the derivation of scalable broadband models fulfilling Kramers-Kronig relationships for use in Time-Domain and Frequency-Domain modeling analysis are drawn.