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Atomic Force Microscopy Used to Improve the Mobility of InSb-based Quantum Wells
Atomic Force Microscopy Used to Improve the Mobility of InSb-based Quantum Wells
1998
Matthew B. Johnson
S. C. Lindstrom
K. J. Goldammer
W K Liu
M. B. Santos
Keywords:
Atomic force microscopy
Quantum well
Materials science
Molecular physics
Correction
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