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Infrared ellipsometric characterization of Si x N y films on textured Si photovoltaic cells
Infrared ellipsometric characterization of Si x N y films on textured Si photovoltaic cells
2008
M. F. Saenger
Martin Schädel
Tino Hofmann
James N. Hilfiker
Jianing Sun
T. E. Tiwald
Mathias Schubert
John A. Woollam
Keywords:
Analytical chemistry
Infrared
Materials science
Photovoltaic system
Optoelectronics
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