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Passivation degradation induced by thermal storage on AlGaN/GaN HEMTs
Passivation degradation induced by thermal storage on AlGaN/GaN HEMTs
2008
Francesca Danesin
Fabio Alessio Marino
Augusto Tazzoli
Franco Zanon
Gaudenzio Meneghesso
Enrico Zanoni
A. Cetronio
C. Lanzieri
Simone Lavanga
M. Peroni
P. Romanini
Keywords:
Gallium nitride
Thermal energy storage
Passivation
High-electron-mobility transistor
Materials science
Inorganic chemistry
Degradation (geology)
algan gan
Optoelectronics
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