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Independent Gate Twin-bit SONOS Flash Memory with Split-gate Effect
Independent Gate Twin-bit SONOS Flash Memory with Split-gate Effect
2010
Kim Yoon
Yun Jang-Gn
Junghoon Lee
Gil Sung Lee
Se Hwan Park
Lee Jong-Ho
Shin Hyungcheol
Park Byung-Gook
Keywords:
Optoelectronics
Charge trap flash
Materials science
Flash memory
Hough transform
gate effect
Correction
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