A New Application for Failure Prognostics – Reduction of Automotive Electronics Reliability Test Duration

This paper presents a novel application of failure prognosis to shorten the time of reliability testing. Typically, prognostic outcome is used to make real time health management decisions such as modify mission plan, change system operation parameters to reduce stress and increase remaining useful life, and more. In this work we demonstrate the use of prognostics to reduce the duration of lengthy and expensive tests, such as power temperaturecycling and high temperature endurance in the automotive electronics validation process.