Novel wavelength measurement scheme using a stabilized interferometric system

A novel interferometric detection scheme for measuring wavelength shift in an optical sensing system is described. In this scheme, in addition to the source wavelength to be measured, a further reference wavelength is employed to stabilize the optical path difference of the interferometer. This is designed to make the wavelength detection system insensitive to environment disturbances such as temperature fluctuation and mechanical vibration, and using this scheme a signal-to-noise ratio improvement of 25 db has been demonstrated.© (1996) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.