Angular, temperature, and impurity effects on secondary electron emission from Ni(110)

The secondary electron emission from a temperature-controlled Ni(110) sample was examined for 50–1500 eV electrons impacting at 0°–35°, 50°, and 78°. Measurements showed a non-cosine dependence on an electron incidence angle: the yield has a maximum at 0°, minima at ±12°, and increases at larger angles up to 35°. This trend in angular dependence is characteristic of single crystal materials and is due to increased secondary electron generation when primary electrons are directed along a close-packed direction. For example, compared to polycrystalline nickel, the yield for Ni(110) from primary electrons at 0° (i.e., along the [110] direction) is up to 36% larger. Additionally, secondary electron yields are highly sensitive to incident electron energy (most notably between 0 and 500 eV) and to the presence of adsorbed carbon monoxide [with an up to 25% decrease compared to clean Ni(110)]. However, yields are independent of sample temperature between 300 and 600 K and of exposure to deuterium ions leading to...