PbTiO3 and PbZrxTi1-zO3 Films:Microstructure and Properties

Hetero-epitaxial PbTiO3 films have been grown on different oxidic substrates. The orientation (the c or a axis being perpendicular to the substrate surface) and the morphology of the PbTiO3 film have been studied with transmission electron microscopy and X-ray diffraction. For non-volatile memory applications ferroelectric capacitors consisting of PbZrxTi1-xO3 films and Pt electrodes are most commonly used. The microstructure of PbZrxTi1-xO3 films (x=0.36 and x=0.71) grown on oxidized silicon provided with a Ti/Pt electrode, will be discussed in relation to the ferrroelectric properties. Finally, the use of La0.5Sr0.5CoO3 as an oxidic electrode is considered.