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Depth-resolved carrier lifetime measurements in 4H-SiC thick epitaxial layers
Depth-resolved carrier lifetime measurements in 4H-SiC thick epitaxial layers
2018
Takashi Hirayama
Mitsuhiro Kushibe
Akira Miyasaka
Kazutoshi Kojima
Tomohisa Kato
Hajime Okumura
Masashi Kato
Keywords:
Optoelectronics
Epitaxy
Carrier lifetime
Materials science
Free carrier absorption
Correction
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