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Dependence of the DC stress negative bias temperature instability effect on basic device parameters in pMOSFET
Dependence of the DC stress negative bias temperature instability effect on basic device parameters in pMOSFET
2012
Cao Jian-min
He Wei
Huang Si-Wen
Zhang Xu-lin
Keywords:
Condensed matter physics
Negative-bias temperature instability
Materials science
device parameters
Correction
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