Effect ofviaprofile oncopper seedlayer deposition forelectroplating

2007 
.. ~~~~For copper plating, atwo-step plating approach iSused. In step(insulation, barrier, andseedlayer deposition) hasbeena thefirst plating step, theforward current density wassetto5 keychallenge formostresearchers because getting these layers 2
    • Correction
    • Cite
    • Save
    • Machine Reading By IdeaReader
    0
    References
    0
    Citations
    NaN
    KQI
    []