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State and Angular Dependence of Single-Event Upsets in an Asymmetric RC-Hardened SRAM Using Deep Trench Capacitors
State and Angular Dependence of Single-Event Upsets in an Asymmetric RC-Hardened SRAM Using Deep Trench Capacitors
2014
Michael L. Alles
Ronald D. Schrimpf
Lloyd W. Massengill
D. R. Ball
Andrew T. Kelly
Nadim F. Haddad
John C. Rodgers
Jason F. Ross
Ernesto Chan
Ashok Raman
Marek Turowski
Keywords:
Nuclear magnetic resonance
Capacitor
Electronic engineering
Static random-access memory
Physics
Trench
deep trench
angular dependence
Correction
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