Characterization of mixed yttria and zirconia thin films

Abstract Films of mixed zirconia and yttria were deposited electrochemically on stainless steel OC4004 from non-aqueous electrolytes based on ethyl alcohol, ZrCl 4 and YCl 3 ·6H 2 O. The film compositions were determined by X-ray photoelectron spectroscopy (XPS). After annealing of the layers, mixed oxides were formed. The changes in the valence-band (VB) below the Fermi level were studied on films with different Y/Zr ratios. SEM study of the electrodeposited layers showed them to be consisting of spherical agglomerates with sizes ranging from 0.1 to 0.5 μm.