In situ absolute magnetometry in an UHV scanning probe microscope using conducting polymer-thin film

The in situ measurement and control of the direction and magnitude of the magnetic field is demonstrated within the sample plane of a low-temperature ultra-high vacuum scanning probe microscope. These measurements utilized electrically detected magnetic resonance magnetometry based on the spin-dependent recombination current in a conducting polymer-thin film. The presented magnetometry approach allows the absolute measurement of systematic magnetic offset fields with a resolution on the order of ≈5μT/Hz with an angular resolution below ≈1°. As the polymer film covers a macroscopic area within the sample plane, magnetometry becomes possible at various locations within the sample plane and thus the determination of magnetic field gradients.