Thermoluminescence properties of SiO2: Al, Eu

Abstract SiO 2 crystals have been used in lasers, fiber amplifiers, electroluminescence devices and thermoluminescence (TL) dosimeters. However, the emission mechanism of TL has not yet been clearly explained. Recently, it has become possible to obtain amorphous, highly pure, SiO 2 prepared by the sol–gel method. The emission mechanism of TL was investigated using SiO 2 samples doped with Al and/or Eu. Two glow peaks were observed on Al,Eu-codoped samples and Eu-doped samples, but a weak glow peak was done on Al-doped samples. In Al,Eu-codoped samples, the TL spectra contained TL spectra of both Al-doped and Eu-doped samples. These results indicate that Al or Eu substitutes for Si and plays the role of a hole trap and/or electron trap, which contributes to the TL phenomenon. In addition, the trap depth was evaluated from two TL glow peaks (ca. 0.5 and 2 eV). From these results, the emission mechanism of TL was obtained.