Cobalt and zinc tetraphenylporphyrins thin films for all optical switching application

Abstract Cobalt and zinc tetraphenylporphyrins have been obtained and characterized by X-ray single crystal diffraction. Their crystal thin films were prepared using direct growth on quartz substrates. The surface morphology of the thin films were studied by atomic force microscopy. The nonlinear optical refraction properties of the thin films were investigated by using closed aperture Z-scan technique with 20 ps (ps) pulses at wavelength 1064 nm. Time-dependent unrestricted Hartree-Fock (TDUHF) with the basis set LanL2DZ were used in computing the linear and non-linear optical properties.