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A Long Stroke Atomic Force Microscope for Surface Profile Measurement of Micro-optics
A Long Stroke Atomic Force Microscope for Surface Profile Measurement of Micro-optics
2016
Ito So
Li Minglei
Chen Yuan‐Liu
Xu Yanhao
Niu Zengyuan
Furuta Masaya
Shimizu Yuki
Gao Wei
Keywords:
Conductive atomic force microscopy
Magnetic force microscope
Atomic force microscopy
Analytical chemistry
Materials science
Optics
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