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NIST Databases for Surface Analysis by Auger-Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
NIST Databases for Surface Analysis by Auger-Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
2003
C. J. Powell
A. Jablonski
Keywords:
NIST
Analytical chemistry
Auger electron spectroscopy
Nuclear magnetic resonance
X-ray photoelectron spectroscopy
Chemistry
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