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Quantification and Mitigation Strategies of Neutron Induced Soft-Errors in CMOS Devices and Components -The Past and Future-
Quantification and Mitigation Strategies of Neutron Induced Soft-Errors in CMOS Devices and Components -The Past and Future-
2011
Eishi Ibe
Kenichi Shimbo
Hitoshi Taniguchi
Tadanobu Toba
Koji Nishii
Yoshio Taniguchi
Keywords:
CMOS
Neutron
Materials science
Electronic engineering
Soft error
Nanotechnology
Correction
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