Investigations of surface irregularities of aluminium thin films evaporated onto rough quartz substrates

Abstract Investigations of surface irregularities of aluminium thin films of different thicknesses evaporated onto rough quartz substrates are described. Profilometric measurements of the irregularities were carried out and the light (incident energy 1.9–4.5 eV) reflected from the surfaces was examined. The influence of coherent and non-coherent light diffusion on the reflected light spectrum was analysed.