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An Electrically Induced Physical Damage (EIPD) Case Study: From Electrical Overstress (EOS) to a Product Defect
An Electrically Induced Physical Damage (EIPD) Case Study: From Electrical Overstress (EOS) to a Product Defect
2017
Chunlei Wu
Keywords:
Failure modes of electronics
Product defect
Engineering
Forensic engineering
Mechanical engineering
Correction
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