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Investigation of hafnium silicide nanostructures on a Si(100) surface by means of photoelectron diffraction
Investigation of hafnium silicide nanostructures on a Si(100) surface by means of photoelectron diffraction
2007
C. Fluechter
D. Weier
A. de Siervo
Richard Landers
M. Schuermann
A. Beimborn
F. Schoenbohm
S. Dreiner
Carsten Westphal
Marcelo Falsarella Carazzolle
George G. Kleiman
Keywords:
Semimetal
Annealing (metallurgy)
Hafnium
Thin film
Electron diffraction
Silicide
Diffraction
Optoelectronics
Materials science
Silicon
Correction
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