Test patterns reordering method based on Gamma distribution

Abstract Aiming at the problem that the test time is too long and the test efficiency is affected, an adaptive test patterns reordering method based on Gamma distribution was proposed. And a probability model based on Gamma distribution for the probability of each test pattern hitting fault was established. During the test, the circuit to be tested was added to the sample space, and the parameters of probability model were updated dynamically, and the test patterns were reordered synchronously. The experimental results showed that the reordered test patterns have higher test quality, which can reduce the test time and test cost of the faulty circuit. The algorithm is completely software-based and does not require any additional hardware overhead and is directly compatible with traditional integrated circuit testing process.