X-ray investigation of the Gd–Zn–Si system

Abstract The isothermal section of the Gd–Zn–Si phase diagram at 600 °C over the whole concentration region has been constructed using X-ray phase analysis and in part microprobe analysis (CAMEBAX-device). The formation of the previously reported phase GdZnSi (AlB 2 structure type) was confirmed, and one new ternary compound was observed. The crystal structure of the GdZn x Si 2− x ( x =0.48–0.54) (α-ThSi 2 structure type) compound was determined using X-ray powder diffraction data. An investigation of the GdSi 2− x -phase also was performed.