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Electron Ptychography Using Fast Binary 4D STEM Data
Electron Ptychography Using Fast Binary 4D STEM Data
2019
Colum M. O'Leary
Emanuela Liberti
Sean M. Collins
Duncan N. Johnstone
Mathias Uller Rothmann
Jingwei Hou
Christopher S. Allen
Js Kim
Thomas D. Bennett
Paul A. Midgley
Angus I. Kirkland
Peter D. Nellist
Keywords:
Analytical chemistry
Binary number
Ptychography
Materials science
Optics
Electron
Correction
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