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Quantitative thin film x-ray microanalysis of Nb modified TiAl
Quantitative thin film x-ray microanalysis of Nb modified TiAl
1989
Alton D. Romig
Thomas Jeffrey Headley
Martin J. Carr
Michael J. Cieslak
Keywords:
Thin film
Intermetallic
Microstructure
Titanium alloy
Titanium
Microanalysis
Titanium aluminide
Materials science
Metallurgy
Electron microscope
Correction
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