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Physics-based Modeling of Hot-Carrier Degradation in Ge NWFETs
Physics-based Modeling of Hot-Carrier Degradation in Ge NWFETs
2019
Stanislav Tyaginov
Adrian Chasin
Alexander Makarov
Al-Moatasem El-Sayed
M. Jech
A. De Keersgieter
Geert Eneman
Michiel Vandemaele
Jacopo Franco
D. Linten
B. Kaczer
Keywords:
hot carrier degradation
Optoelectronics
physics based
Materials science
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