Method and apparatus for built-in self-test

A kind of equipment includes: non-clock and data recovery (CDR) components of one or more on substrate；Signal generator on the substrate, the signal generator are couple at least one of one or more of non-CDR components；And the CDR component on the substrate, the CDR component is couple to one or more of non-CDR components, wherein the CDR component is configured as through the CDR component from the signal recovered clock data received, and is configured as determining signal based on the signal received and the clock data.