5th International Conference on Silicon Photovoltaics, SiliconPV 2015 Experimental determination of the uncertainty of the absorption coefficient of crystalline silicon

Based on a combined analysis of spectroscopic ellipsometry, reflectance and transmittance measurements as well as spectrally resolved luminescence measurements and spectral responsivity measurements, we present data of the coefficient of band-to-band absorption of crystalline silicon at 295 K in the wavelength range 250 – 1450 nm. A systematic measurement uncertainty analysis according to the “Guide to the Expression of Uncertainty in Measurements” (GUM) is carried out for each method, showing that the relative uncertainty of the absorption coefficient data so determined is of the order of 0.3% at 300 nm, 1% at 900 nm, 10% at 1200 nm and 180% at 1450 nm. The data are consolidated by comparison of measurements carried out independently at different institutions. The uncertainty of solar cell energy conversion predictions by means of simulations due to the uncertainty of the absorption coefficient data is shown to be of the order of 0.1% relative.