Built-in-test for processor-based modules

This article describes a software methodology for built-in-test (BIT) for processor based modules. Firstly, an example of the hardware comprising a common processor module is given. This is followed by a description of the BIT software architecture and details of the component elements: the test executive, which integrates all the components and provides the interface to external applications and boot programs; the BIT reconfiguration table, for test control flexibility; test result handling; and the individual test functions, written in both assembly language and C. This BIT product is extremely flexible, portable, and very thorough are high fault detection, high isolation coverage, and support for unique test requirements.