Predicting Photovoltaic Module Series Resistance based on Indoor-Aging Tests and Thermal Cycling Cumulative Exposure Estimates

The IEC 61215 and Qualification Plus indoor aging tests are recognized as valuable assessment procedures for identifying photovoltaic (PV) modules that are prone to early-life failures or excessive degradation. However, it is unclear how well the tests match with reality, and if they can predict in-field performance. Therefore, the present work performed indoor-aging thermal cycling tests on pristine-condition modules and evaluated, using in-field current and voltage (I-V) curve scans, modules of the same make and model exposed to the actual environment within a production field. The experiment included the estimate of the overall exposure to thermal cycling in both indoor and outdoor environments, the extraction of the series resistance from the I-V curves, the development of a model based on the indoor results, and finally the testing of the model on outdoor exposure amounts to predict actual changes in resistance. Index Terms—photovoltaic, accelerated aging, series resistance