ELECTRON MICROPROBE ANALYSIS AND SCANNING ELECTRON MICROSCOPY IN GEOLOGY (2nd ed.)by S.J.B. Reed, Cambridge University Press, August 2005. 206 pages, $70.00

In this book, the author aims to describe electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) from a geologic standpoint, a goal that he clearly states on the first page. The author adequately meets this goal throughout the book. He initially provides discussion of how EMPA and SEM can be used to answer specific geologic questions and later gives examples, illustrations, and images of geologic data acquired using these techniques. The material is not necessarily presented in a “how-to” manner of conducting EMPA and SEM analyses, instead the author provides background material that needs to be considered when setting up for such analyses. The book consists mostly of individual chapters designed to explain the principles, instrumentation, and techniques of EMPA and SEM. The book is well illustrated and offers several …