Homoepitaxial Growth of Crystalline Ge Films through a Liquid Metal Medium at Low Temperature

1990 
Crystalline films of Ge have been homoepitaxially grown through a liquid Au medium by the so-called vapor-liquid-solid (VLS) mechanism at relatively low temperature (400-450 °C). During the process, the Ge vapor is delivered by a molecular beam evaporator and the liquid phase in the system is formed at the interface by heating a Au metal film above its eutectic point with the semiconductor. This process has a potential of a high growth rate at low temperature. The growth process and the crystallinity of the films were monitored in situ by high energy ion backscattering and channeling. The surface morphology and quality of the films were examined by scanning electron microscopy and cross-sectional transmission electron microscopy. The experimental results are presented, together with a discussion of the growth mechanism and the nature of the liquid metal-semiconductor interface.
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