APartial ScanBasedTestGeneration for Asynchronous Circuits

Test Generation forasynchronous circuit isahardgeneration. Testgeneration forcyclic circuit beingahard problem mainly duetotheabsence ofaglobal clock. Full scanproblem, anoveltechnique totest thecyclic asynchronous design based test generation ofasynchronous circuits seems tobe circuit usingthetest patterns generated fromtheir acyclic feasible butatanexpense oflarge areaoverhead. Partial scanequivalent hasbeenproposed. Several methods forgenerating should beabetter option withlower area overhead butthere isno acyclic circuit fromcyclic circuits havebeenintroduced lately knownsystematic way ofselecting whichasynchronous (6,7).Butthemethods arerestricted forthecyclic circuit state-holding elements toscan. Thispaper presents apartial scanwithout state holding elements andwhichdoesnotoscillate. andautomatic test generation methodology basedonanovelButoscillations arepredominant inasynchronous cyclic adaptation ofBALLASTforasynchronous circuits andtimecircuits andalsopresence ofstate holding elements like frameunrolling. Balanced structures areusedtoguidethec-elements arecommoninthem.Soamethodtoconvert the selection ofthestate-holding elements thatwill bescanned. A cyclic circuits toacyclic circuits isalso introduced. Numberof cyclic toacyclic conversion oftheinput circuit isusedtocreate a memoryelements selected forscanchain isdetermined by combinational circuit forwhich test patterns areeasily generated using thebalanced structures basedonpartial scanselection using well knownmethods. These test patterns arethenusedto method usedin(8,9). test theoriginal circuit. Fault coverage andareaoverhead results Theorganization ofthepaper isasfollows. Section 2gives the ofthis method areobtained andanalyzed withfull scanandotherbackground. Proposed algorithms forthetestmethodare methods. discussed insection 3.Section 4briefs thetest methodology.