Old Web
English
Sign In
Acemap
>
Paper
>
40nm ultra-low leakage SRAM at 170 deg.C operation for embedded flash MCU
40nm ultra-low leakage SRAM at 170 deg.C operation for embedded flash MCU
2014
Yokoyama Yoshisato
Ishii Yuichiro
Kojima Hidemitsu
Miyanishi Atsushi
Tsujihashi Yoshiki
Asayama Shinobu
Shiba Kazutoshi
Tanaka Koji
Fukuda Tatsuya
Nii Koji
Yanagisawa Kazumasa
Keywords:
Leak
Microcontroller
Leakage (electronics)
Static random-access memory
Embedded system
Electronic engineering
Materials science
Electrical engineering
leakage power
low leakage
Correction
Source
Cite
Save
Machine Reading By IdeaReader
0
References
0
Citations
NaN
KQI
[]