Characterization and Processing of CdS/ZnS Thin Layer Films Deposited onto Quartz for Solar Cell Applications

Abstract In this work, synthesis and processing of CdS/ZnS multilayer thin film systems are studied; compositional changes within these thin films structures are investigated by the Rutherford backscattering (RBS) technique to determine the depth distributions of the mixed region and stoichiometry according to Rump simulation which is used to estimate layer thickness and compositions even for complex samples; depth profiling using this program is also determined. The RBS data reveal a more homogeneous film could be obtained after annealing in 400°C and stoichiometric film structures with composition Cd1–xZnxS, where x=0.6 are synthesized in ZnS/CdS bilayer