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Investigation of Low-Cost Stress Memorization Process on Layout and Low-Frequency Noise Performance for Strained-Si nMOSFETs
Investigation of Low-Cost Stress Memorization Process on Layout and Low-Frequency Noise Performance for Strained-Si nMOSFETs
2010
C. W. Kuo
San-Lein Wu
Hong Lin
Y. T. Huang
S. J. Chang
D. G. Hong
Chung-Yu Wu
Y. C. Cheng
O. Cheng
Keywords:
Memorization
Electronic engineering
Materials science
Infrasound
Optoelectronics
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