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Substrate effect on radiation-induced charge trapping in buried oxide for partially-depleted SOI NMOSFET
Substrate effect on radiation-induced charge trapping in buried oxide for partially-depleted SOI NMOSFET
2020
Huilong Zhu
Dawei Bi
Xin Xie
Zhiyuan Hu
Zhengxuan Zhang
Shichang Zou
Keywords:
Substrate (chemistry)
Trapping
Optoelectronics
Computer science
Optics
Electrostatic induction
Radiation
buried oxide
Silicon on insulator
radiation induced
Absorbed dose
Correction
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