Positron annihilation in annealed and quenched teflon and in sulphur

The value (τ2) and the intensity (I2) of the delayed component in the lifetime spectra of positrons annihilating in annealed and quenched teflon and in sulphur and crystex (polymer sulphur), at room temperature and at 77° K are reported. These data and the X-ray diffraction patterns for these materials are discussed in terms of the free volume model for the formation and quenching of positronium atoms in molecular materials.