Old Web
English
Sign In
Acemap
>
Paper
>
High-accuracy reflectance mapping of microopticalcomponents
High-accuracy reflectance mapping of microopticalcomponents
2000
Stefan Nerreter
Ruediger Grunwald
A. Barwolff
Jens W. Tomm
Keywords:
Thin film
Reflectivity
Analytical chemistry
Materials science
Optics
Optoelectronics
Correction
Source
Cite
Save
Machine Reading By IdeaReader
0
References
0
Citations
NaN
KQI
[]